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Originally published in 1952, The Government of British Trade
Unions analyses the government, in theory and in practice, of one
of Britain's most important labour organizations - The Transport
and General Works Union in the first half of the 20th Century. It
is an appraisal of the role of the rank and file within this union
of over one million members, to determine both the opportunity for,
and the extent of their participation in, this State within a
State. Original sources and materials, which had not previously
been made public in relation to any major British or American Trade
Union, were used to ascertain member turnover, participation in
elections, attendance at Branch meetings and the effect of the
repeal of the Trade Disputes Act on Labour Party membership. The
study is of great interest both for the light it throws on the
general question of Trade Unions in the modern State, and for its
analysis of the Transport and General Works Union itself.
One of America's most respected Buddhist teachers distills a lifetime of practice and teaching in this groundbreaking exploration of the new Buddhist tradition taking root on American soil.
This book has its origins in the intensive short courses on
scanning elec tron microscopy and x-ray microanalysis which have
been taught annually at Lehigh University since 1972. In order to
provide a textbook containing the materials presented in the
original course, the lecturers collaborated to write the book
Practical Scanning Electron Microscopy (PSEM), which was published
by Plenum Press in 1975. The course con tinued to evolve and expand
in the ensuing years, until the volume of material to be covered
necessitated the development of separate intro ductory and advanced
courses. In 1981 the lecturers undertook the project of rewriting
the original textbook, producing the volume Scan ning Electron
Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained
substantial expansions of the treatment of such basic material as
electron optics, image formation, energy-dispersive x-ray
spectrometry, and qualitative and quantitative analysis. At the
same time, a number of chapters, which had been included in the
PSEM vol ume, including those on magnetic contrast and electron
channeling con trast, had to be dropped for reasons of space.
Moreover, these topics had naturally evolved into the basis of the
advanced course. In addition, the evolution of the SEM and
microanalysis fields had resulted in the devel opment of new
topics, such as digital image processing, which by their nature
became topics in the advanced course.
This text provides students as well as practitioners with a
comprehensive introduction to the field of scanning electron
microscopy (SEM) and X-ray microanalysis. The authors emphasize the
practical aspects of the techniques described. Topics discussed
include user-controlled functions of scanning electron microscopes
and x-ray spectrometers and the use of x-rays for qualitative and
quantitative analysis. Separate chapters cover SEM sample
preparation methods for hard materials, polymers, and biological
specimens. In addition techniques for the elimination of charging
in non-conducting specimens are detailed.
This book has evolved by processes of selection and expansion from
its predecessor, Practical Scanning Electron Microscopy (PSEM),
published by Plenum Press in 1975. The interaction of the authors
with students at the Short Course on Scanning Electron Microscopy
and X-Ray Microanalysis held annually at Lehigh University has
helped greatly in developing this textbook. The material has been
chosen to provide a student with a general introduction to the
techniques of scanning electron microscopy and x-ray microanalysis
suitable for application in such fields as biology, geology, solid
state physics, and materials science. Following the format of PSEM,
this book gives the student a basic knowledge of (1) the
user-controlled functions of the electron optics of the scanning
electron microscope and electron microprobe, (2) the
characteristics of electron-beam-sample inter actions, (3) image
formation and interpretation, (4) x-ray spectrometry, and (5)
quantitative x-ray microanalysis. Each of these topics has been
updated and in most cases expanded over the material presented in
PSEM in order to give the reader sufficient coverage to understand
these topics and apply the information in the laboratory.
Throughout the text, we have attempted to emphasize practical
aspects of the techniques, describing those instru ment parameters
which the microscopist can and must manipulate to obtain optimum
information from the specimen. Certain areas in particular have
been expanded in response to their increasing importance in the SEM
field. Thus energy-dispersive x-ray spectrometry, which has
undergone a tremendous surge in growth, is treated in substantial
detail.
From its early days in the 1950s, the electron microanalyzer has
offered two principal ways of obtaining x-ray spectra: wavelength
dispersive spectrometry (WDS), which utilizes crystal diffraction,
and energy dispersive spectrometry (EDS), in which the x-ray
quantum energy is measured directly. In general, WDS offers much
better peak separation for complex line spectra, whereas EDS gives
a higher collection efficiency and is easier and cheaper to use.
Both techniques have undergone major transformations since those
early days, from the simple focusing spectrometerand gas
proportional counter of the 1950s to the advanced semiconductor
detectors and programmable spectrometersoftoday.
Becauseofthesedevelopments, thecapabilities and relative merits of
EDS and WDS techniques have been a recurring feature of
microprobeconferences for nearly40 years, and this volume
bringstogetherthepapers presented at the Chuck Fiori Memorial
Symposium, held at the Microbeam Analysis Society Meeting of 1993.
Several themes are apparent in this rich and authoritative
collection of papers, which have both a historical and an
up-to-the-minute dimension. Light element analysis has long been a
goal of microprobe analysts since Ray Dolby first detected K
radiation with a gas proportional counter in 1960. WDS techniques
(using carbon lead stearate films) were not used for this purpose
until four years later. Now synthetic multilayers provide the best
dispersive elements for quantitative light element analy sis-still
used in conjunction with a gas counter.
In the spring of 1963, a well-known research institute made a
market survey to assess how many scanning electron microscopes
might be sold in the United States. They predicted that three to
five might be sold in the first year a commercial SEM was
available, and that ten instruments would saturate the marketplace.
In 1964, the Cambridge Instruments Stereoscan was introduced into
the United States and, in the following decade, over 1200 scanning
electron microscopes were sold in the U. S. alone, representing an
investment conservatively estimated at $50,000- $100,000 each. Why
were the market surveyers wrongil Perhaps because they asked the
wrong persons, such as electron microscopists who were using the
highly developed transmission electron microscopes of the day, with
resolutions from 5-10 A. These scientists could see little
application for a microscope that was useful for looking at
surfaces with a resolution of only (then) about 200 A. Since that
time, many scientists have learned to appreciate that information
content in an image may be of more importance than resolution per
se. The SEM, with its large depth of field and easily that often
require little or no sample prepara interpreted images of samples
tion for viewing, is capable of providing significant information
about rough samples at magnifications ranging from 50 X to 100,000
X. This range overlaps considerably with the light microscope at
the low end, and with the electron microscope at the high end."
In the last decade, since the publication of the first edition of
Scanning Electron Microscopy and X-ray Microanalysis, there has
been a great expansion in the capabilities of the basic SEM and
EPMA. High resolution imaging has been developed with the aid of an
extensive range of field emission gun (FEG) microscopes. The
magnification ranges of these instruments now overlap those of the
transmission electron microscope. Low-voltage microscopy using the
FEG now allows for the observation of noncoated samples. In
addition, advances in the develop ment of x-ray wavelength and
energy dispersive spectrometers allow for the measurement of
low-energy x-rays, particularly from the light elements (B, C, N,
0). In the area of x-ray microanalysis, great advances have been
made, particularly with the "phi rho z" Ij)(pz)] technique for
solid samples, and with other quantitation methods for thin films,
particles, rough surfaces, and the light elements. In addition,
x-ray imaging has advanced from the conventional technique of "dot
mapping" to the method of quantitative compositional imaging.
Beyond this, new software has allowed the development of much more
meaningful displays for both imaging and quantitative analysis
results and the capability for integrating the data to obtain
specific information such as precipitate size, chemical analysis in
designated areas or along specific directions, and local chemical
inhomogeneities."
From its early days in the 1950s, the electron microanalyzer has
offered two principal ways of obtaining x-ray spectra: wavelength
dispersive spectrometry (WDS), which utilizes crystal diffraction,
and energy dispersive spectrometry (EDS), in which the x-ray
quantum energy is measured directly. In general, WDS offers much
better peak separation for complex line spectra, whereas EDS gives
a higher collection efficiency and is easier and cheaper to use.
Both techniques have undergone major transformations since those
early days, from the simple focusing spectrometerand gas
proportional counter of the 1950s to the advanced semiconductor
detectors and programmable spectrometersoftoday.
Becauseofthesedevelopments, thecapabilities and relative merits of
EDS and WDS techniques have been a recurring feature of
microprobeconferences for nearly40 years, and this volume
bringstogetherthepapers presented at the Chuck Fiori Memorial
Symposium, held at the Microbeam Analysis Society Meeting of 1993.
Several themes are apparent in this rich and authoritative
collection of papers, which have both a historical and an
up-to-the-minute dimension. Light element analysis has long been a
goal of microprobe analysts since Ray Dolby first detected K
radiation with a gas proportional counter in 1960. WDS techniques
(using carbon lead stearate films) were not used for this purpose
until four years later. Now synthetic multilayers provide the best
dispersive elements for quantitative light element analy sis-still
used in conjunction with a gas counter."
During the last four decades remarkable developments have taken
place in instrumentation and techniques for characterizing the
microstructure and microcomposition of materials. Some of the most
important of these instruments involve the use of electron beams
because of the wealth of information that can be obtained from the
interaction of electron beams with matter. The principal
instruments include the scanning electron microscope, electron
probe x-ray microanalyzer, and the analytical transmission electron
microscope. The training of students to use these instruments and
to apply the new techniques that are possible with them is an
important function, which. has been carried out by formal classes
in universities and colleges and by special summer courses such as
the ones offered for the past 19 years at Lehigh University.
Laboratory work, which should be an integral part of such courses,
is often hindered by the lack of a suitable laboratory workbook.
While laboratory workbooks for transmission electron microscopy
have-been in existence for many years, the broad range of topics
that must be dealt with in scanning electron microscopy and
microanalysis has made it difficult for instructors to devise
meaningful experiments. The present workbook provides a series of
fundamental experiments to aid in "hands-on" learning of the use of
the instrumentation and the techniques. It is written by a group of
eminently qualified scientists and educators. The importance of
hands-on learning cannot be overemphasized.
Since the publication in 1979 of Introduction to Analytical
Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C.
Joy; Plenum Press), analytical electron microscopy has continued to
evolve and mature both as a topic for fundamental scientific
investigation and as a tool for inorganic and organic materials
characterization. Significant strides have been made in our
understanding of image formation, electron diffraction, and
beam/specimen interactions, both in terms of the "physics of the
processes" and their practical implementation in modern
instruments. It is the intent of the editors and authors of the
current text, Principles of Analytical Electron Microscopy, to
bring together, in one concise and readily accessible volume, these
recent advances in the subject. The text begins with a thorough
discussion of fundamentals to lay a foundation for today's
state-of-the-art microscopy. All currently important areas in
analytical electron microscopy-including electron optics, electron
beam/specimen interactions, image formation, x-ray microanalysis,
energy-loss spectroscopy, electron diffraction and specimen
effects-have been given thorough attention. To increase the utility
of the volume to a broader cross section of the scientific
community, the book's approach is, in general, more descriptive
than mathematical. In some areas, however, mathematical concepts
are dealt with in depth, increasing the appeal to those seeking a
more rigorous treatment of the subject.
The mind contains the seeds of its own awakening-seeds that we can
cultivate to bring forth the fruits of a life lived consciously.
With Mindfulness, Joseph Goldstein shares the wisdom of his four
decades of teaching and practice in a book that will serve as a
lifelong companion for anyone committed to mindful living and the
realization of inner freedom. Goldstein's source teaching is the
Satipa??hana Sutta, the Buddha's legendary discourse on the four
foundations of mindfulness that became the basis for the many types
of Vipassana (or insight meditation) found today. Exquisite in
detail yet wholly accessible and relevant for the modern student,
Mindfulness takes us through a profound study of: * Mindfulness of
body, including the breath, postures, activities, and physical
characteristics * Mindfulness of feelings-how the experience of our
sense perceptions influences our inner and outer worlds *
Mindfulness of mind-learning to recognize skillful and unskillful
states of mind and thought * Mindfulness of dhammas (or categories
of experience), including the Five Hindrances, the Six Sense
Spheres, and the Seven Factors of Awakening "There is a wealth of
meaning and nuance in the experience of mindfulness that can enrich
our lives in unimagined ways," writes Goldstein. In Mindfulness you
have the tools to mine these riches for yourself.
"Whatever you are doing should be done mindfully, dynamically, with
totality and completeness. Then it becomes meditation. It is not
thinking, but experiencing from moment to moment, living from
moment to moment, without clinging, without condemning, without
judging."--Munindra
Anagarika Munindra (1915-2003) was a Bengali Buddhist master and
scholar who became one of the most important Vipassana meditation
teachers of the twentieth century. Unassuming, genuine, and always
encouraging, Munindra embodied the Buddhist teachings, exemplifying
mindfulness in everything he did.
"Living This Life Fully "is the first book about Munindra, and it
features never-before-published excerpts of his teachings, stories
and remembrances from Western students, a biography, and rare
photographs.
Since the publication in 1979 of Introduction to Analytical
Electron Microscopy (ed. J. J. Hren, J. I. Goldstein, and D. C.
Joy; Plenum Press), analytical electron microscopy has continued to
evolve and mature both as a topic for fundamental scientific
investigation and as a tool for inorganic and organic materials
characterization. Significant strides have been made in our
understanding of image formation, electron diffraction, and
beam/specimen interactions, both in terms of the "physics of the
processes" and their practical implementation in modern
instruments. It is the intent of the editors and authors of the
current text, Principles of Analytical Electron Microscopy, to
bring together, in one concise and readily accessible volume, these
recent advances in the subject. The text begins with a thorough
discussion of fundamentals to lay a foundation for today's
state-of-the-art microscopy. All currently important areas in
analytical electron microscopy-including electron optics, electron
beam/specimen interactions, image formation, x-ray microanalysis,
energy-loss spectroscopy, electron diffraction and specimen
effects-have been given thorough attention. To increase the utility
of the volume to a broader cross section of the scientific
community, the book's approach is, in general, more descriptive
than mathematical. In some areas, however, mathematical concepts
are dealt with in depth, increasing the appeal to those seeking a
more rigorous treatment of the subject.
"Anatta" is the Buddhist teaching on the nonexistence of a
permanent, independent self. It's a notoriously puzzling and
elusive concept, usually leading to such questions as, "If I don't
have a self, who's reading this sentence?" It's not that there's no
self there, says Rodney Smith. It's just that the self that is
reading this sentence is a configuration of elements that at one
time did not exist and which at some point in the future will
disperse. Even in its present existence, it's more a temporary
arrangement of components rather than something solid. "Anatta "is
a truth the Buddha considered to be absolutely essential to his
teaching. Smith shows that understanding this truth can change the
way you relate to the world, and that the perspective of
selflessness is critically important for anyone involved in
spiritual practice. Seeing it can be the key to getting past the
idea that spirituality has something to do with self-improvement,
and to accessing the joy of deep insight into reality.
Introduces the central teachings of Buddhism and the practice of
insight meditation, covering such topics as proper meditation
practice, developing compassion and wisdom, and understanding the
laws of karma. Reprint. printing.
A classic text that has been cited in more than 1,000 child custody
cases, Beyond the Best Interests of the Child, published in 1973,
immediately set a new standard for safeguarding a child's growth
and development. The second volume of the trilogy, Before the Best
Interests of the Child (1979), defines when the state should
intervene. The final volume, In the Best Interests of the Child
(1986), establishes professional boundaries within child custody
cases.
Written by top experts in the field of child welfare, these
three landmark books are now available in one paperback volume. The
authors have revised and updated the texts and added topical new
information on a variety of important subjects, including
trans-racial adoption, surrogate parents, gay and lesbian couples,
children of HIV-positive parents, abortion, and teenage pregnancy.
Broad in scope and brilliantly researched by the nation's top
experts, The Best Interests of the Child is indispensable reading
for social workers, family court judges, lawyers, psychologists,
and concerned parents.
The second volume in a classic trilogy of works by Joseph
Goldstein, former Sterling Professor Emeritus of Law at Yale Law
School; Albert J. Solnit, the former director of the Yale Child
Study Center, and Anna Freud, daughter of Sigmund Freud. These
texts (Beyond the Best Interests of the Child was the first in the
series, and In the Best Interests of the Child was the third) are
classic references often cited in child custody cases; Before the
Best Interests of the Child specifically addresses when the state
should intervene. Rather than the familiar legal "best interests of
the child" doctrine, the authors's work is based on the more
realistic standard of finding the "least detrimental alternative."
This is indispensable reading for social workers, family court
judges, lawyers, psychologists, and parents.
Beyond the Best Interests of the Child is the first volume in a
classic trilogy of works by Joseph Goldstein, former Sterling
Professor Emeritus of Law at Yale Law School; Albert J. Solnit, the
former director of the Yale Child Study Center, and Anna Freud,
daughter of Sigmund Freud. This collection of texts are classic
references often cited in child custody cases. Rather than the
familiar legal "best interests of the child" doctrine, the authors'
work is based on the more realistic standard of finding the "least
detrimental alternative." This is indispensable reading for social
workers, family court judges, lawyers, psychologists, and parents.
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